Test beyond today's limits
with Exaddon
Products - Semiconductor industry
MicroLED Probe Card:
Test next-generation display technology with precision and reliability
Our customizable, modular probe cards boost test efficiency, maximize yield, and increase throughput, accelerating production while delivering consistent results beyond the limits of conventional testing.
WAT Probe Card:
Accelerate wafer testing with precision and reliability
Our modular, customizable WAT probe cards deliver consistent contact, maximize yield, and accelerate throughput across production wafers. Engineered for durability where conventional probes fail, they reduce downtime, simplify integration, and provide dependable results for advanced semiconductor testing.
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Custom probing solutions:
Solve unique testing challenges with tailored probe cards
From microbumps and four-point contacts to low-invasive pad scrub tests and other fine-pitch applications, our customizable probe cards deliver precise, reliable solutions designed for your specific requirements
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Products - Academic and industrial R&D
CERES micro-3D printing system:
Advance your research with micro-scale metal 3D printing
CERES, a standalone printing system, brings Exaddon's proprietary micro-3D printing technology to research environments, allowing the creation of sub-micron structures in pure metals. Designed for precision, flexibility, and repeatable results, CERES empowers researchers to explore new geometries, test novel concepts, and accelerate discovery in advanced microfabrication.
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