Smarter Contact. Higher Yield.
Probe cards with micro-3D printed probes for precise and reliable
electroluminescence (EL) testing of next-generation display technology.
Probe what's next. Today.
Exaddon microLED probe cards remove testing as a bottleneck
MicroLED wafer testing requires contacting millions of fragile devices at fine pitch, and conventional probing is either slow, damaging the pads, or struggles to scale to fine pitches with consistent accuracy.
Exaddon’s microLED probe cards with metal micro-3D printed probes address these challenges by enabling multi-parallel testing with ultra-low contact force and sub-20µm pitch capability. This allows fast EL testing while minimizing pad damage and supporting reliable wafer-level characterization. Rapid 3D-printed probe customization supports evolving test layouts, while modular, swap-in probe heads reduce downtime and simplify maintenance.
The result is faster wafer-level testing, protected microLED pads, and higher yield at lower cost of ownership.
MicroLED Probe Card:
Enabling efficient & reliable electroluminescence (EL)
testing of next-generation display technology
We offer highly precise probe cards with micro-3D printed probes, validated by independent partners and pilot customers for wafer-level electroluminescence (EL) testing, delivering performance beyond conventional probe technologies.
Our customizable, modular probe cards boost test efficiency, maximize yield, and increase
throughput, accelerating production while delivering consistent results beyond the limits of
conventional testing.
testing
Overcome slow
test cycles
force
Prevents microLED
damage
(<20 µm)
Pushes the limits
of miniaturization
Adapts to diverse device
designs
Reduced downtime and
repair delays
From wafer to yield: fast, precise, protected
Turn wafers into insights - efficiently and reliably
MicroLED probe head specifications
All parameters are interdependent. They are customizable per customer requirements.
| Probe positioning accuracy (x, y) | ±2µm |
| Probe pitch (x) | > 10µm |
| Probe z - planarity | ±2µm |
| Scrub mark depth | <100nm |
| Scrub mark length | 5µm |
| Tip length | 10µm-200µm |
| Probe count | 2 - 512 |
| Probe shape (can be fully customized) | cantilever |
| Reliable electrical contact @ (OD) | 12µm |
| Touchdowns (lifetime) | >1 million |
Validated in real-world test environments