We enable probing that was
previously impossible
From ultra-fine pitch probing and ultra-low leakage parametrics to deep-trench
contact and coax-shielded high-RF measurements,
we enable testing beyond today's limits
MicroLED testing
Test next-generation display technology with precision and reliability
Exaddon microLED probe cards enable multi-parallel, <20µm pitch electro-luminescence (EL) testing with ultra-low contact force. Accelerate yield learning and wafer-level characterization while protecting fragile pads, without testing limiting throughput.
Discover
more
WAT/parametric testing
Maintain measurement integrity as device complexity increases
Manufacturing advanced products demands the highest level of process control, enabled by ultra‑low‑leakage probes. We add value by providing precision probing across shrinking pads and generating more real‑estate for transistors. Exaddon’s micro-3D printed probes provide controlled contact behavior and geometry tailored to deep trench structures and sensitive parametric measurements, enabling reliable data collection across wafers and process iterations.
Discover
more
Custom testing solutions
Adapt probing to your device
Emerging devices, novel layouts, and specialized test requirements often exceed the constraints of standard probe architectures. Exaddon leverages micro-3D printed probe geometries to design application-specific solutions, from unique pad configurations to RF and high-frequency concepts, enabling test strategies aligned with your device roadmap.
Discover
more