Smarter Contact. Tailored to Your Application.
Custom testing solutions with micro-3D printed probes
designed to address advanced pad layouts and test requirements
Let's solve your probing challenge
Our probe cards are engineered to enable efficient
wafer testing,
where conventional probes reach their limits
As devices shrink and complexity increase, conventional
probe technologies struggle with
alignment,
compliance, and durability, limiting yield, throughput, and innovation.
Exaddon's probe cards address these challenges using micro-3D printed probes that
deliver precision,
reliability, and scalable performance.
High contact precision
Tailored probe geometry
Rapid
customization
Seamless
integration
Replacable
probe cards
Testing solutions tailored to your application
Developed in close collaboration
Custom solutions are developed in close collaboration with our customers, from initial feasibility assessment to prototype evaluation. This iterative approach ensures technical alignment, realistic performance targets, and efficient development cycles.
How we engineer the right probing solution for you
Application and requirement review
Feasibility assessment and concept design
Prototype
manufacturing
Evaluation and optimization
Tailored probe card ready for testing